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The Only Solution For Module Test

Tanisys Technology, the leader in DRAM and flash module test equipment, introduces the next generation DRAM test system.  The M1K test system is the solution for 400 to 800MHz+ DDR/DDR2 module test, as well as FB-DIMM.

Today's price pressures on memory make highly parallel testing critical.  With the M1K, Tanisys offers a cost-effective DDR test solution:  highly efficient parallel test capabilities that address the DRAM market's throughput and cost of test requirements without sacrificing fault coverage.

Flexibility By Design

Tanisys Technology designed the M1K with flexibility and scalability in mind using the versatile, patented Distributed Network Architecture (DNA).  As the building block of advanced parallel test solutions, DNA enables users to seamlessly transition from engineering development to high-volume production.  In combination with high performance M1K hardware, DNA provides virtually unlimited scalability that allows users to add capacity as needed - a capability not found in other test platforms.

Production Ready

Whether you choose your own handler or ask Tanisys to provide a full solution, the M1K facilitates easy migration to automated production environments.  For module customers in manual environments, the M1K can be easily configured to support testing status LEDs at each DUT site.  Whatever your plan for production, the M1K is backed by Tanisys expertise and our extensive global support network.

Configurations To Meet Demand

Whether your needs are for R&D, Failure Analysis, or high volume Production, the M1K will meet your requirements.  As a single blade engineering system, the M1K-E can be used to develop your test program in an office or lab environment without affecting production capacity.  Available with powerful engineering tools including Bitmap, Shmoo and Auto-timing, the M1K-E provides a full capability, small form-factor system for Engineering or Failure Analysis environments.  The M1K is also available in a multiple blade production chassis suitable for highly parallel device or module test.

Correlations To Traditional ATE

Flexibility and lower cost of test are just a few of the benefits of the M1K, but these features would be of little value if the system could not capture the failures of your current test platform. In recent head-to-head correlation exercises, the M1K has proven to meet the performance levels of the industry standard ATE systems.  With the M1K, Tanisys offers the performance of traditional ATE at an affordable cost of ownership. 

Worldwide Support

Tanisys offer technical support to production facilities around the globe through strategic partnerships in Korea, Japan, Taiwan, China, Singapore and Europe.  Services include sales and distribution, full technical support, applications engineering and spares coverage - the same world class, hands-on support provided to customers in North America.